Quantitative calibration and germanium SIMS depth profiling in Ge x Si1 − x /Si heterostructures
Crossref DOI link: https://doi.org/10.1134/S1063782614080090
Published Online: 2014-08-06
Published Print: 2014-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Drozdov, M. N.
Drozdov, Yu. N.
Novikov, A. V.
Yunin, P. A.
Yurasov, D. V.
Text and Data Mining valid from 2014-08-01