Variations in the electrical properties of silicon MOS structures with a nanodimensional silicon oxide under the effect of water vapors
Crossref DOI link: https://doi.org/10.1134/S1063782614080119
Published Online: 2014-08-06
Published Print: 2014-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fastykovsky, P. P.
Glauberman, M. A.
Text and Data Mining valid from 2014-08-01
