On the nature of cracks using single-crystalline silicon subjected to anodic etching as an example
Crossref DOI link: https://doi.org/10.1134/S1063782614080120
Published Online: 2014-08-06
Published Print: 2014-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gerasimenko, N. N.
Tynyshtykbaev, K. B.
Starkov, V. V.
Medetov, N. A.
Tokmoldin, S. Zh.
Gosteva, E. A.
Text and Data Mining valid from 2014-08-01
Version of Record valid from 2014-08-01
Article History
Received: 30 May 2013
Accepted: 6 December 2013
First Online: 6 August 2014