Determination of the structural and optical characteristics of Cu2ZnSnS4 semiconductor thin films
Crossref DOI link: https://doi.org/10.1134/S1063782614100273
Published Online: 2014-10-09
Published Print: 2014-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sheleg, A. U.
Hurtavy, V. G.
Mudryi, A. V.
Valakh, M. Ya.
Yukhymchuk, V. O.
Babichuk, I. S.
Leon, M.
Caballero, R.
Text and Data Mining valid from 2014-10-01
Version of Record valid from 2014-10-01
Article History
Received: 5 March 2014
Accepted: 26 March 2014
First Online: 9 October 2014