Temperature dependence of the carrier lifetime in Cd x Hg1 − x Te narrow-gap solid solutions with consideration for Auger processes
Crossref DOI link: https://doi.org/10.1134/S1063782615040065
Published Online: 2015-04-16
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bazhenov, N. L.
Mynbaev, K. D.
Zegrya, G. G.
Text and Data Mining valid from 2015-04-01
