Effect of the interaction conditions of the probe of an atomic-force microscope with the n-GaAs surface on the triboelectrization phenomenon
Crossref DOI link: https://doi.org/10.1134/S1063782615080060
Published Online: 2015-08-02
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Baklanov, A. V.
Gutkin, A. A.
Kalyuzhnyy, N. A.
Brunkov, P. N.
Text and Data Mining valid from 2015-08-01