Degradation of the electrical characteristics of MOS structures with erbium, gadolinium, and dysprosium oxides under the effect of an electric field
Crossref DOI link: https://doi.org/10.1134/S1063782615080199
Published Online: 2015-08-02
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shalimova, M. B.
Sachuk, N. V.
Text and Data Mining valid from 2015-08-01