Laser interferometric method for determining the carrier diffusion length in semiconductors
Crossref DOI link: https://doi.org/10.1134/S1063782615090201
Published Online: 2015-09-03
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Manukhov, V. V.
Fedortsov, A. B.
Ivanov, A. S.
Text and Data Mining valid from 2015-09-01
