Features of the diagnostics of metamorphic InAlAs/InGaAs/InAlAs nanoheterostructures by high-resolution X-ray diffraction in the ω-scanning mode
Crossref DOI link: https://doi.org/10.1134/S1063782616040242
Published Online: 2016-05-15
Published Print: 2016-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vasil’evskii, I. S.
Pushkarev, S. S.
Grekhov, M. M.
Vinichenko, A. N.
Lavrukhin, D. V.
Kolentsova, O. S.
Text and Data Mining valid from 2016-04-01