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Study of the correlation properties of the surface structure of nc-Si/a-Si:H films with different fractions of the crystalline phase

Crossref DOI link: https://doi.org/10.1134/S1063782616050031

Published Online: 2016-05-15

Published Print: 2016-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Alpatov, A. V.

Vikhrov, S. P.

Kazanskii, A. G.

Lyaskovskii, V. L.

Rybin, N. B.

Rybina, N. V.

Forsh, P. A.
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