Experimental determination of the derivative of the current–voltage characteristic of a nonlinear semiconductor structure using modulation Fourier analysis
Crossref DOI link: https://doi.org/10.1134/S1063782616060129
Published Online: 2016-06-17
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kuzmichev, N. D.
Vasyutin, M. A.
Shilkin, D. A.
Text and Data Mining valid from 2016-06-01
Version of Record valid from 2016-06-01
Article History
Received: 15 July 2015
Accepted: 30 November 2015
First Online: 17 June 2016