Growth features and spectroscopic structure investigations of nanoprofiled AlN films formed on misoriented GaAs substrates
Crossref DOI link: https://doi.org/10.1134/S1063782616090219
Published Online: 2016-09-16
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Seredin, P. V.
Goloshchapov, D. L.
Lenshin, A. S.
Lukin, A. N.
Fedyukin, A. V.
Arsentyev, I. N.
Bondarev, A. D.
Lubyanskiy, Y. V.
Tarasov, I. S.
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