On the crystal structure and thermoelectric properties of thin Si1–x Mn x films
Crossref DOI link: https://doi.org/10.1134/S1063782616110105
Published Online: 2016-11-06
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Erofeeva, I. V.
Dorokhin, M. V.
Lesnikov, V. P.
Zdoroveishchev, A. V.
Kudrin, A. V.
Pavlov, D. A.
Usov, U. V.
Text and Data Mining valid from 2016-11-01
Version of Record valid from 2016-11-01
Article History
Received: 27 April 2016
Accepted: 10 May 2016
First Online: 6 November 2016