Study of the parameters of nanoscale layers in nanoheterostructures based on II–VI semiconductor compounds
Crossref DOI link: https://doi.org/10.1134/S1063782617010080
Published Online: 2017-02-10
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Karavaev, M. B.
Kirilenko, D. A.
Ivanova, E. V.
Popova, T. B.
Sitnikova, A. A.
Sedova, I. V.
Zamoryanskaya, M. V.
Text and Data Mining valid from 2017-01-01
Version of Record valid from 2017-01-01
Article History
Received: 28 May 2016
Accepted: 24 June 2016
First Online: 10 February 2017