Study of silicon doped with zinc ions and annealed in oxygen
Crossref DOI link: https://doi.org/10.1134/S1063782617020154
Published Online: 2017-02-10
Published Print: 2017-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Privezentsev, V. V.
Kirilenko, E. P.
Goryachev, A. N.
Batrakov, A. A.
License valid from 2017-02-01