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Electron mobility in the inversion layers of fully depleted SOI films

Crossref DOI link: https://doi.org/10.1134/S1063782617040248

Published Online: 2017-04-21

Published Print: 2017-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Zaitseva, E. G.

Naumova, O. V.

Fomin, B. I.
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Text and Data Mining valid from 2017-04-01

Version of Record valid from 2017-04-01
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Article History

Received: 13 July 2016

Accepted: 1 August 2016

First Online: 21 April 2017