X-Ray Diffraction Analysis of Features of the Crystal Structure of GaN/Al0.32Ga0.68N HEMT-Heterostructures by the Williamson–Hall Method
Crossref DOI link: https://doi.org/10.1134/S1063782618060209
Published Online: 2018-05-15
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pushkarev, S. S.
Grekhov, M. M.
Zenchenko, N. V.
Text and Data Mining valid from 2018-05-15
Article History
Received: 6 June 2017
Accepted: 19 June 2017
First Online: 15 May 2018