Effect of High-Dose Carbon Implantation on the Phase Composition, Morphology, and Field-Emission Properties of Silicon Crystals
Crossref DOI link: https://doi.org/10.1134/S1063782618090245
Published Online: 2018-08-22
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yafarov, R. K.
Text and Data Mining valid from 2018-08-22
Article History
Received: 2 October 2017
First Online: 22 August 2018