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Effect of Low-Dose Proton Irradiation on the Electrical Characteristics of 4H-SiC Junction Diodes

Crossref DOI link: https://doi.org/10.1134/S1063782618100056

Published Online: 2018-09-06

Published Print: 2018-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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