Analysis of the Features of Hot-Carrier Degradation in FinFETs
Crossref DOI link: https://doi.org/10.1134/S1063782618100081
Published Online: 2018-09-06
Published Print: 2018-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Makarov, A. A.
Tyaginov, S. E.
Kaczer, B.
Jech, M.
Chasin, A.
Grill, A.
Hellings, G.
Vexler, M. I.
Linten, D.
Grasser, T.
Text and Data Mining valid from 2018-09-06
Article History
Received: 24 February 2018
First Online: 6 September 2018