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Avalanche Breakdown Stability of High Voltage (1430 V) 4H-SiC p+–n0–n+ Diodes

Crossref DOI link: https://doi.org/10.1134/S1063782618120126

Published Online: 2018-11-07

Published Print: 2018-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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