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Radiation-Induced Damage of Silicon-Carbide Diodes by High-Energy Particles

Crossref DOI link: https://doi.org/10.1134/S1063782618130171

Published Online: 2018-12-24

Published Print: 2018-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Strel’chuk, A. M.

Kozlovski, V. V.

Lebedev, A. A.
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Text and Data Mining valid from 2018-12-01

Version of Record valid from 2018-12-01
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Article History

Received: 4 July 2018

Accepted: 9 July 2018

First Online: 24 December 2018