Annealing of FIB-Induced Defects in GaAs/AlGaAs Heterostructure
Crossref DOI link: https://doi.org/10.1134/S1063782618140178
Published Online: 2018-12-27
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Levitskii, I. V.
Mitrofanov, M. I.
Voznyuk, G. V.
Nikolaev, D. N.
Mizerov, M. N.
Evtikhiev, V. P.
Text and Data Mining valid from 2018-12-01
Article History
First Online: 27 December 2018