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Current Noise and Efficiency Droop of Light-Emitting Diodes in Defect-Assisted Carrier Tunneling from an InGaN/GaN Quantum Well

Crossref DOI link: https://doi.org/10.1134/S1063782619010032

Published Online: 2019-04-23

Published Print: 2019-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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