Effect of the Electric Mode and γ Irradiation on Surface-Defect Formation at the Si–SiO2 Interface in a MOS Transistor
Crossref DOI link: https://doi.org/10.1134/S1063782619010123
Published Online: 2019-04-23
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kulikov, N. A.
Popov, V. D.
Text and Data Mining valid from 2019-01-01
Article History
Received: 26 April 2018
Accepted: 25 June 2018
First Online: 23 April 2019