Investigation into the Radiation Hardness of Photodiodes Based on Silicon-on-Sapphire Structures
Crossref DOI link: https://doi.org/10.1134/S1063782619030084
Published Online: 2019-04-23
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kabalnov, Yu. A.
Trufanov, A. N.
Obolensky, S. V.
Text and Data Mining valid from 2019-03-01
Article History
Received: 10 January 2018
Accepted: 13 September 2018
First Online: 23 April 2019