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Effect of Electron Irradiation with an Energy of 0.9 MeV on the I–V Characteristics and Low-Frequency Noise in 4H–SiC pin Diodes

Crossref DOI link: https://doi.org/10.1134/S1063782619040080

Published Online: 2019-05-06

Published Print: 2019-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Dobrov, V. A.

Kozlovski, V. V.

Mescheryakov, A. V.

Usychenko, V. G.

Chernova, A. S.

Shabunina, E. I.

Shmidt, N. M.
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Article History

Received: 21 November 2018

Revised: 29 November 2018

Accepted: 29 November 2018

First Online: 6 May 2019