Antisite Defects in Ge–Te and Ge–As–Te Semiconductor Glasses
Crossref DOI link: https://doi.org/10.1134/S1063782619050166
Published Online: 2019-05-23
Published Print: 2019-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Marchenko, A. V.
Seregin, P. P.
Terukov, E. I.
Shakhovich, K. B.
Text and Data Mining valid from 2019-05-01
Version of Record valid from 2019-05-01
Article History
Received: 27 November 2018
Revised: 3 December 2018
Accepted: 10 December 2018
First Online: 23 May 2019