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Model of the Effect of the Gate Bias on MOS Structures under Ionizing Radiation

Published Online: 2020-03-03

Published Print: 2020-02

Authors

Aleksandrov, O. V.

Mokrushina, S. A.
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Text and Data Mining valid from 2020-02-01

Version of Record valid from 2020-02-01
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Article History

Received: 25 June 2019

Revised: 10 September 2019

Accepted: 30 September 2019

First Online: 3 March 2020

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