Profiling Mobility Components near the Heterointerfaces of Thin Silicon Films
Crossref DOI link: https://doi.org/10.1134/S1063782620020219
Published Online: 2020-03-03
Published Print: 2020-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zaitseva, E. G.
Naumova, O. V.
Fomin, B. I.
Text and Data Mining valid from 2020-02-01
Version of Record valid from 2020-02-01
Article History
Received: 26 September 2019
Revised: 15 October 2019
Accepted: 15 October 2019
First Online: 3 March 2020
CONFLICT OF INTEREST
: The authors declare that they have no conflict of interest.