Kelvin Probe Force Microscopy Study of the Electrostatic System of the Crystal Surface of AuNi/GaN Schottky Diodes
Crossref DOI link: https://doi.org/10.1134/S1063782620030185
Published Online: 2020-04-27
Published Print: 2020-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Torkhov, N. A.
Novikov, V. A.
Text and Data Mining valid from 2020-03-01
Version of Record valid from 2020-03-01
Article History
Received: 3 July 2019
Revised: 20 September 2019
Accepted: 21 October 2019
First Online: 27 April 2020
CONFLICT OF INTEREST
: The authors declare that they have no conflict of interest.