Simulation of Carrier Trapping in an Embedded Nanowire and Its Effect in the Nano-EBIC Technique
Crossref DOI link: https://doi.org/10.1134/S106378262101005X
Published Online: 2021-02-03
Published Print: 2021-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
El Hdiy, A.
Ledra, M.
Text and Data Mining valid from 2021-01-01
Version of Record valid from 2021-01-01
Article History
Received: 5 May 2020
Revised: 2 September 2020
Accepted: 12 September 2020
First Online: 3 February 2021
CONFLICT OF INTEREST
: The authors declare that they have no conflict of interest.