Latent Accumulation of Surface States in MOS Structures after Exposure to Ionizing Radiation
Crossref DOI link: https://doi.org/10.1134/S1063782621070046
Published Online: 2022-02-10
Published Print: 2021-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Aleksandrov, O. V.
Text and Data Mining valid from 2021-06-01
Version of Record valid from 2021-06-01
Article History
Received: 1 March 2021
Revised: 12 March 2021
Accepted: 12 March 2021
First Online: 10 February 2022
CONFLICT OF INTEREST
: The authors declare that they have no conflict of interest.