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Electron-Microscopy Studies of the Structure of Thin Epitaxial Ge2Sb2Te5 Layers Grown on Si(111) Substrates

Crossref DOI link: https://doi.org/10.1134/S106378262113011X

Published Online: 2021-12-30

Published Print: 2021-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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