Effect of Temperature and Magnetic Field on Electron Mobility in SiGe/Si/SiGe–layer Structures
Crossref DOI link: https://doi.org/10.1134/S1063782624601341
Published Online: 2024-11-02
Published Print: 2024-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Muoi, Do
Text and Data Mining valid from 2024-07-01
Version of Record valid from 2024-07-01
Article History
Received: 19 August 2024
Revised: 3 September 2024
Accepted: 6 September 2024
First Online: 2 November 2024
CONFLICT OF INTEREST
: As author of this work, I declare that I have no conflicts of interest.