Diagnostics of the atomic structure of multilayer metallic nanoheterostructures from reflectometry data: A new approach to low-contrast systems
Crossref DOI link: https://doi.org/10.1134/S1063783414090042
Published Online: 2014-09-02
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Babanov, Yu. A.
Salamatov, Yu. A.
Ustinov, V. V.
Mukhamedzhanov, E. Kh.
Text and Data Mining valid from 2014-09-01