Role of edge dislocations in plastic relaxation of GeSi/Si(001) heterostructures: Dependence of introduction mechanisms on film thickness
Crossref DOI link: https://doi.org/10.1134/S1063783415040071
Published Online: 2015-04-16
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bolkhovityanov, Yu. B.
Gutakovskii, A. K.
Deryabin, A. S.
Sokolov, L. V.
Text and Data Mining valid from 2015-04-01