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Upper critical field of niobium nitride thin films

Crossref DOI link: https://doi.org/10.1134/S1063783416020311

Published Online: 2016-02-18

Published Print: 2016-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Vasyutin, M. A.

Kuz’michev, N. D.

Shilkin, D. A.
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Text and Data Mining valid from 2016-02-01

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Article History

Received: 8 July 2015

First Online: 18 February 2016