Crossmark

Structure and properties of deposited films in composite samples SiO2/YSZ/CeO2/YBa2Cu3O y

Published Online: 2016-08-13

Published Print: 2016-08

Authors

Blinova, Yu. V.

Snigirev, O. V.

Porokhov, N. V.

Sudareva, S. V.

Krinitsina, T. P.

Degtyarev, M. V.
License Information

Text and Data Mining valid from 2016-08-01

Version of Record valid from 2016-08-01
More Information

Article History

Received: 15 February 2016

First Online: 13 August 2016

Document is current