Response of the capacitance and dielectric loss of the SrRuO3/SrTiO3/SrRuO3 film heterostructures to variations in temperature and electric field
Crossref DOI link: https://doi.org/10.1134/S1063783416100115
Published Online: 2016-10-19
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Boikov, Yu. A.
Danilov, V. A.
License valid from 2016-10-01
