Transformation of point defects in silicon dioxide during annealing
Crossref DOI link: https://doi.org/10.1134/S1063783416100188
Published Online: 2016-10-19
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ivanova, E. V.
Zamoryanskaya, M. V.
License valid from 2016-10-01