Spectral ellipsometry as a method for characterization of nanosized films with ferromagnetic layers
Crossref DOI link: https://doi.org/10.1134/S1063783417110142
Published Online: 2017-11-17
Published Print: 2017-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hashim, H.
Singkh, S. P.
Panina, L. V.
Pudonin, F. A.
Sherstnev, I. A.
Podgornaya, S. V.
Shpetnyi, I. A.
Beklemisheva, A. V.
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