Phase Formation and Electronic Structure Peculiarities in the Al1 – xSi x Film Composites under the Conditions of Magnetron and Ion-Beam Sputtering
Crossref DOI link: https://doi.org/10.1134/S1063783418050311
Published Online: 2018-05-23
Published Print: 2018-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Terekhov, V. A.
Usol’tseva, D. S.
Serbin, O. V.
Zanin, I. E.
Kulikova, T. V.
Nesterov, D. N.
Barkov, K. A.
Sitnikov, A. V.
Lazaruk, S. K.
Domashevskaya, E. P.
Text and Data Mining valid from 2018-05-01
Version of Record valid from 2018-05-01
Article History
Received: 14 June 2017
First Online: 23 May 2018