Structural and Electric Characteristics of Two-Layer Bi4Ti3O12/(Ba,Sr)TiO3 Thin Films Deposited on a Silicon Substrate by Radio-Frequency Sputtering at Increased Oxygen Pressures
Crossref DOI link: https://doi.org/10.1134/S1063783419020033
Published Online: 2019-04-22
Published Print: 2019-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Anokhin, A. S.
Biryukov, S. V.
Golovko, Yu. I.
Mukhortov, V. M.
Text and Data Mining valid from 2019-02-01
Article History
Received: 27 June 2018
Accepted: 13 August 2018
First Online: 22 April 2019