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Microstructure of Si Crystals Subjected to Irradiation with High-Energy H+ Ions and Heat Treatment by High-Resolution Three-Crystal X-Ray Diffraction and Transmission Electron Microscopy

Crossref DOI link: https://doi.org/10.1134/S1063783419100068

Published Online: 2019-10-03

Published Print: 2019-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Asadchikov, V. E.

D’yachkova, I. G.

Zolotov, D. A.

Chukhovskii, F. N.

Sorokin, L. M.
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Text and Data Mining valid from 2019-10-01

Version of Record valid from 2019-10-01
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Article History

Received: 29 May 2019

Revised: 29 May 2019

Accepted: 4 June 2019

First Online: 3 October 2019

CONFLICT OF INTEREST

: The authors declare that they have no conflicts of interest.

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