Peculiarities of the electron structure of nanosized ion-implanted layers in silicon
Crossref DOI link: https://doi.org/10.1134/S106378421411022X
Published Online: 2014-11-15
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rysbaev, A. S.
Khuzhaniyazov, Zh. B.
Normuradov, M. T.
Rakhimov, A. M.
Bekpulatov, I. R.
Text and Data Mining valid from 2014-11-01
Version of Record valid from 2014-11-01
Article History
Received: 16 January 2014
First Online: 15 November 2014