High-voltage sharp-recovery 4H:SiC drift diodes: Theoretical estimation of limiting parameters
Crossref DOI link: https://doi.org/10.1134/S1063784215060092
Published Online: 2015-06-25
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ivanov, P. A.
Grekhov, I. V.
Text and Data Mining valid from 2015-06-01