Scanning tunneling microscopy observation of ultrathin epitaxial CoSi2(111) films grown at a high temperature
Crossref DOI link: https://doi.org/10.1134/S1063784215100023
Published Online: 2015-11-05
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Alekseev, A. A.
Olyanich, D. A.
Utas, T. V.
Kotlyar, V. G.
Zotov, A. V.
Saranin, A. A.
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