Determination of thickness of ultrathin surface films in nanostructures from the energy spectra of reflected electrons
Crossref DOI link: https://doi.org/10.1134/S1063784215100205
Published Online: 2015-11-05
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kupreenko, S. Yu.
Orlikovskii, N. A.
Rau, E. I.
Tagachenkov, A. M.
Tatarintsev, A. A.
Text and Data Mining valid from 2015-10-01