Atomic Force Microscopy Measurement of the Resistivity of Semiconductors
Crossref DOI link: https://doi.org/10.1134/S1063784218080182
Published Online: 2018-08-16
Published Print: 2018-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Smirnov, V. A.
Tominov, R. V.
Alyab’eva, N. I.
Il’ina, M. V.
Polyakova, V. V.
Bykov, Al. V.
Ageev, O. A.
Text and Data Mining valid from 2018-08-01
Article History
Received: 24 May 2017
First Online: 16 August 2018